Femtosecond laser interaction with pulsed-laser deposited carbon thin films of nanoscale thickness
The dependence of optical, electronic and thermal penetration zones on the thickness of nanoscale layers grown on silicon wafers is reported. Tetrahedral amorphous carbon (ta-C) and amorphous carbon nitride (a-C(x)N(y)) films were prepared by inverse pulsed laser deposition (IPLD). Single-pulse modi...
Elmentve itt :
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| Dokumentumtípus: | Cikk |
| Megjelent: |
2011
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| Sorozat: | APPLIED PHYSICS A - MATERIALS SCIENCE AND PROCESSING
102 No. 1 |
| doi: | 10.1007/s00339-010-6013-5 |
| mtmt: | 1892884 |
| Online Access: | http://publicatio.bibl.u-szeged.hu/18193 |